December 13, 2012
Fraunhofer IISB, Erlangen
Fraunhofer IISB, Erlangen
Bosch etching for high volume silicon removal in MEMS applications
Markus Menath, Infineon Technologies Austria AG, Villach, Austria
Silicon etch solutions for emerging MEMS device fabrication and advanced packaging technologies
Dave Thomas, SPTS Technologies GmbH, Dresden, Germany
Isotropic dielectric etches for power semiconductors
Joachim Hirschler, Infineon Technologies Austria AG, Villach, Austria
Atomistic Simulation of Cu Metallization
Manfred Schneegans, Infineon Technologies AG, Munich, Germany
Atomistic Modeling for the Electronics Industry - An Overview
Volker Eyert, Materials Design, Montrouge, France
Influence of PE-SiH4 interlayer oxide deposition on Bi-polar transistor performance
Michael Woittennek, X-FAB Dresden GmbH & Co. KG, Dresden, Germany
Second source process kit hardware for semiconductor manufacturing equipment
Walter Nadrag, Sico Technology GmbH, Bleiberg-Kreuth, Austria
Framework for Integration of Virtual Metrology and Predictive Maintenance
Georg Roeder, Fraunhofer IISB, Erlangen, Germany
Application of Predictive Maintenance for semiconductor manufacturing equipment
Ulrich Schöpka, Fraunhofer IISB, Erlangen, Germany