November 27/28, 2002
Fraunhofer IISB, Erlangen
Fraunhofer IISB, Erlangen
Neue Materialien
Trends in process control - an overview of APC
Dr. Claus Schneider, Fraunhofer IISB, Erlangen, Germany
MOCVD of advanced materials - A survey of the latest achievements on production processes and equipment
Dr. Marcus Schumacher, Aixtron AG, Aachen, Germany
Atomic Layer Chemical Vapor Deposition technologies for the 90 nm technology node and beyond
Dr. Jan Willem Maes, ASM Europe bv, Bilthoven, The Netherlands
Pulsed deposition of ultra thin tungsten and its application for plug fill of high aspect ratio contacts
Michael Woitge, Novellus Systems GmbH, Dresden, Germany
Copper-, barrier-, seed-layers: New deposition techniques
Uwe Richter, Applied Materials GmbH, Dresden, Germany
Diffusion barrier deposition technologies for W-plug and Cu/low k systems
Dr. Stephen Burgess, Trikon Technologies Ltd., Newport, United Kingdom
Prozessverbesserungen durch APC
APC at Infineon
Dr. Hans-Peter Erb, Infineon Technologies AG, Munich, Germany
Implementation and experiences with APC in CPD (CVD+PVD)
Karl Hörmann, Infineon Technologies AG, Munich, Germany
APC applications etch, CVD at Infineon Vi
Dr. Michael Holzinger, Infineon Technologies AG, Villach, Austria
Plasma process simulation for APC
Prof. Dr. rer. nat. Ralf Peter Brinkmann, Ruhr-Universität Bochum, Bochum, Germany