Fields of Research and Service
Lifetime testing of power semiconductors and modules including wide-bandgap devices for product development or qualification e.g. according to AQG324:
- Generation of lifetime data incl. PCmin, PCsec
- Statistical analysis and interpretation of measured lifetime data
- Transient thermal characterization incl. thermal resistance Rth
- Lifetime modelling and prediction for die attach technologies and power modules
- Long time experience on power cycling tests and analyzing of failure mechanisms
- Consultancy on test planning, failure modes, and result interpretation