Semilab and Fraunhofer IISB Upgrade Joint (U)WBG Metrology Lab

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© Elisabeth Iglhaut / Fraunhofer IISB
From left to right: Dr. Michael Weber (Lab Manager SiC Epitaxy, Fraunhofer IISB), Ivan Shekerov (Application Engineer, Semilab), Dr. Robin Karhu (Scientist SiC Epitaxy, Fraunhofer IISB), Silvia Poppa (Senior Manager Global Sales, Semilab), Gerard Krzych (Senior Customer Service & Application Engineer, Semilab), Dr. Gennadi Polisski (Application Scientist, Semilab)

The establishment of our industry-compatible joint lab with Semilab Zrt is progressing: we've just got an upgrade to the latest CnCV technology. The new advancements in non-contact corona charge C-V characterization enable a CnCV Kinetic mode to boost measurement speed and throughput - taking performance to the next level.

Our colleagues Dr. Michael Weber and Dr. Robin Karhu from the SiC Epitaxy Group at the IISB welcomed the Semilab team with Silvia Poppa (Senior Manager Global Sales), Gerard Krzych (Senior Customer Service & Application Engineer), Dr. Gennadi Polisski (Application Scientist), and Ivan Shekerov (Application Engineer).

Together, we are pushing the precision and reliability of measurements on (U)WBG semiconductor substrates to the limits. This is how we pave the way for a significant improvement in material quality.

© Daniel Karmann / Fraunhofer IISB
© Daniel Karmann / Fraunhofer IISB
© Daniel Karmann / Fraunhofer IISB

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